Doping of β-FeSi2 films with boron and arsenic by sputtering and its application for optoelectronic devices

Zhengxin Liu, Masato Osamura, Teruhisa Ootsuka, Shinan Wang, Yasuhiro Fukuzawa, Yasuhito Suzuki, Ryo Kuroda, Takahiro Mise, Naotaka Otogawa, Yasuhiko Nakayama, Hisao Tanoue, Yunosuke Makita

Optical Materials 27 (5) 942-947 (2005) · Elsevier BV

DOI: 10.1016/j.optmat.2004.08.040

Data: JSON record · id doi:10.1016/j.optmat.2004.08.040 · metadata: crossref

Roles in ORCHID

• cited as the original source of values

Systems

Si–Yb

Evidence in ORCHID

1 values in 1 other papers cite this work as their source.

ESPEI datasets derived: 1 (experimental/SI-YB/SiYb-05Bru.zpf-15.json).

Phase-registry phases citing it: phase:si-yb:liquid

Availability

Read by ORCHID: no (full_text_screened_for_origin). Open-access licence (Crossref license field): none deposited. Crossref is-referenced-by count: 26 (retrieved 2026-10-23).

Relations

Cited by (Crossref reference lists) (2)

• Thermodynamic assessment of the Yb–Si system (2005) [crossref_reference_list]
• Lattice stability of Ca, Sr and Yb disilicides (2006) [crossref_reference_list]

Cited for values by (1)

• Thermodynamic assessment of the Yb–Si system (2005) — 1 values [orchid_extraction]

Used in (assessments / papers that took values from it) (1)

• Thermodynamic assessment of the Yb–Si system (2005) — 1 values [orchid_extraction]